是否进口:否 | 加工定制:否 | 品牌:Helios |
型号:AUDIODEV Helios HL50 |
全新/二手/租赁AUDIODEV Helios 1xCSS/HL50 Helios LAB-rc Wafer Solar 电池片测试仪
AUDIODEV Helios 1xCSS/HL50 Helios LAB-rc Wafer Solar
Helios LAB-rc, a good investment!
TheHeliosLAB-rcsystem can beoperated without anyspecial
skills. It is very easy to operate. With the integrated manual
single-axis table aline scan on asolar wafer can be perfomed
very fast. Thespecial designed sampletableallowsto measure
on everyposition on asix inch wafer.
Dark position and Reference sample at a fixed position are
integrated in the manual single-axis table. This allows quick
dark and reference measurement within a few seconds. After
that, the user may run a continuous measurement while
moving the sample, or just measure a few specific points on
the sample. The software allows to make a measurement
report and data storage for each measured wafer in a
comfortableway.
Functions of Helios LAB-rc
The new Helios LAB-rc All-In-One Version includes all
hardwarecomponentsin onecompact housing. It isan easy to
use manual measurement system that enables you to measure
the total reflectance of polished and textured solar wafers. In
addition it measures the color and the layer thickness of
coatedwafers
Single-point measurement √
Integral total spectral reflectance measurement √
Wavelength and reflectance value at lowest reflectance √
Reflectance at user-definable wavelength √
Coating layer thickness √
User-definable quality limits √
Good / Bad indication √
Integrated fixed reference √
Average Reflectance within a selectable wavelength interval √
Color evaluation √
Manual single axis table √
Manual full wafer mapping √
Measurement Parameters Reflectance / Layer thickness
/ Color
MEASUREMENT
Reflectance Range 0 ~ 100 %
Wavelength Range 380 ~ 1050 nm
Thickness Range (SiN) 25 ~ 120 nm
(SiO) 35 ~ 160 nm
Reflectance Accuracy ±0.1 %
Reflectance Repeatability* <0.05%
Thickness Accuracy ±1 nm
Thickness Repeatability* ±0.2 nm
Color Measurement Lab / xyY / XYZ / Lch
Color Accurracy x,y 3σ ±0.004 / Y 3σ ±0.5
Color Repeatability* x,y 3σ <0.002 / Y 3σ <0.2