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全新/二手/租赁AUDIODEV Helios HL50 LAB-rc 电池片反射率测试仪

全新/二手/租赁AUDIODEV Helios HL50 LAB-rc 电池片反射率测试仪

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刘先生
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𐂝𐂞𐂟 𐂠𐂡𐂢𐂢 𐂝𐂢𐂟𐂠
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  • 发货地:广东 东莞
  • 发货期限:60天内发货
  • 供货总量: 10套
东莞市湘龙自动化设备有限公司 入驻平台 第8
  • 资质核验已核验企业营业执照
  • 刘先生
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  • 𐂝𐂞𐂟 𐂠𐂡𐂢𐂢 𐂝𐂢𐂟𐂠
  • 广东 东莞
  • 光伏组件检测设备,摩托车盔检测设备,消防头盔检测设备,护具检测设备

联系方式

  • 联系人:
    刘先生
  • 手   机:
    𐂝𐂞𐂟𐂠𐂡𐂢𐂢𐂝𐂢𐂟𐂠
  • 地   址:
    广东 东莞 清溪镇 浦星西路73号
是否进口:否加工定制:否品牌:Helios
型号:AUDIODEV Helios HL50

全新/二手/租赁AUDIODEV Helios HL50 LAB-rc 电池片反射率测试仪详细介绍

全新/二手/租赁AUDIODEV Helios 1xCSS/HL50 Helios LAB-rc Wafer Solar 电池片测试仪

AUDIODEV Helios 1xCSS/HL50 Helios LAB-rc Wafer Solar 

Helios LAB-rc, a good investment!

TheHeliosLAB-rcsystem can beoperated without anyspecial

skills. It is very easy to operate. With the integrated manual

single-axis table aline scan on asolar wafer can be perfomed

very fast. Thespecial designed sampletableallowsto measure

on everyposition on asix inch wafer.

Dark position and Reference sample at a fixed position are

integrated in the manual single-axis table. This allows quick

dark and reference measurement within a few seconds. After

that, the user may run a continuous measurement while

moving the sample, or just measure a few specific points on

the sample. The software allows to make a measurement

report and data storage for each measured wafer in a

comfortableway.


Functions of Helios LAB-rc

The new Helios LAB-rc All-In-One Version includes all

hardwarecomponentsin onecompact housing. It isan easy to

use manual measurement system that enables you to measure

the total reflectance of polished and textured solar wafers. In

addition it measures the color and the layer thickness of

coatedwafers


Single-point measurement √

Integral total spectral reflectance measurement √

Wavelength and reflectance value at lowest reflectance √

Reflectance at user-definable wavelength √

Coating layer thickness √

User-definable quality limits √

Good / Bad indication √

Integrated fixed reference √

Average Reflectance within a selectable wavelength interval √

Color evaluation √

Manual single axis table √

Manual full wafer mapping √

Measurement Parameters Reflectance / Layer thickness

/ Color

MEASUREMENT

Reflectance Range 0 ~ 100 %

Wavelength Range 380 ~ 1050 nm

Thickness Range (SiN) 25 ~ 120 nm

(SiO) 35 ~ 160 nm

Reflectance Accuracy ±0.1 %

Reflectance Repeatability* <0.05%

Thickness Accuracy ±1 nm

Thickness Repeatability* ±0.2 nm

Color Measurement Lab / xyY / XYZ / Lch

Color Accurracy x,y 3σ ±0.004 / Y 3σ ±0.5

Color Repeatability* x,y 3σ <0.002 / Y 3σ <0.2



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